Testing

1. Measuring refractive index and thickness
   Equipment: Ellipsometer
   
2. Measuring thickness
   Equipment: Profilometer
   
3. Measuring semiconductor parameters
   Equipment: HP4145
   
4. Measuring small features
   Equipment: Optical Microscope
   Equipment: Scanning Electron Microscope (SEM) [contact John Gardner]
   Equipment: Atomic Force Microscope (AFM) [contact Robert Davis]